MDPI is preparing a special Issue "Nanotechnology: Techniques and Instrumentations for Modelling and Characterization Data" with the MMAMA consortium.
We would like to invite you to submit your work to a Special Issue on “Nanotechnology - Techniques & Instrumentations for Modelling & Characterization Data”. This is a joint special issue of Applied Sciences with an on-going Eu project - “Microwave Microscopy for Advanced and Efficient Materials Analysis and Production” and its two sister projects.
The accurate knowledge of micro- and nanoscale effects leading to unique chemical/electrical/optical/mechanical properties of materials is the key for development and quality control of the innovative nano-enabled products. Therefore, the precise and quantitative characterization techniques of the nanostructure of nanomaterials, nanosystems, and nanodevices at the nanometer scale by using advanced Instrumentations and novel techniques became a necessity. Further, various numerical modeling strategies have been developed to provide a new clarity to comprehend the structure and properties of nanomaterials.
The aim of this issue is to offer an opportunity to global in-the-filed scholars to share the novel approachs, techniques and instrumentations for modelling and characterization of nanomaterials at the nanoscale. Specifically, topics of interest for this Special Issue include (but are not limited to):
- State of the art measurement techniques and instruments at the micro- to nanoscale level
- Methodologies for the quantitative characterization (AFM, STM, SEM, TEM, Mass spectrometry, etc)
- Standards for nanometer scale Characterization
- Precision instrumentation design and theory
- Reference materials, measurement standards, etc
- New and emerging measurement and analysis technologies
- New developments in modeling and simulations at the nanoscale
The core of the Special issue will consist of papers affiliated to the H2020 MMAMA project (https://www.mmama.eu/) and its collaborating partners, but additional papers are welcome. Contributions can take the form of either research papers or comprehensive review articles.
More details: https://www.mdpi.com/journal/applsci/special_issues/Nanotechnology_Modelling_Characterization
